COMET announces the next-generation FEINFOCUS COUGAR-VXP (Versatile X-ray Platform): SMT Version, a new X-ray inspection system for maximum operator flexibility. Developed by the global leader in microfocus X-ray inspection, the new SMT Version of the COUGAR-VXP addresses the advanced inspection requirements specific to SMT production, such as BGA, µBGA, and wafer-level chip scale packages.

Powered by user-friendly FEINFOCUS Graphical User Interface (FGUI) software, the COUGAR-VXP includes a microfocus X-ray tube up to 160 Kv, standard 5-axes manipulator with Auto Isocentric Motion (AIM) Technology(TM) for oblique viewing, CNC Capabilities, FEINFOCUS HDX-ray(TM) real-time 16-bit image processing, CMOS digital flat panel detector, and a hardware-driven anti-collision system. The system provides feature recognition down to 1 µm, with a total magnification of up to 6,000x and True X-ray Intensity (TXI) Control(TM) that guarantees stable and permanent image quality, time after time.

Users of the versatile COUGAR-VXP: SMT Version may add features such as BGA and die-attach void calculation modules, a more sophisticated manipulator system, and a multifocus X-ray tube up to 160 kV.

The small, ergonomic design of the COUGAR-VXP makes this platform ideal for any assembly environment, as it features a small footprint (approximately 1 m x 1 m), low system weight (approximately 1,450 kg), and convenient front- and side-door service access.

A Failure Analysis (F/A) configuration of the COUGAR-VXP is also available, featuring a 6" image intensifier with digital CCD camera, standard microfocus X-ray tube up to 160 kV, and 4-axes manipulator.

FEINFOCUS, a COMET business unit, is a leading global supplier of award-winning high-resolution X-ray inspection systems. The combined resources of COMET and FEINFOCUS provide the most complete offering of X-ray technology and products in the world. FEINFOCUS offers full radiation-shielded X-ray systems and X-ray sources, as well as complete in-house X-ray services, such as failure analysis, component defect detection, technical support, and preventative maintenance for both FEINFOCUS and third-party systems. As pioneers of microfocus and nanofocus X-ray inspection technology, the company developed the first patented "open" X-ray tube in 1982, and remains an industry leader in non-destructive testing for electronics, semiconductor, and related industries.